Heinzelmann, H. and Meyer, E. and Grutter, P. and Hidber, H. R. and Rosenthaler, L. and Guntherodt, H. J.. (1988) Atomic force microscopy : general aspects and application to insulators. Journal of vacuum science & technology. A, Vacuum, surfaces and films, Vol. 6, H. 2. pp. 275-278.
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Official URL: http://edoc.unibas.ch/dok/A5262173
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| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | American Vacuum Society |
| ISSN: | 0734-2101 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 22 Mar 2012 14:26 |
| Deposited On: | 22 Mar 2012 13:54 |
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