Baumeister, B. and Jung, T. A. and Meyer, E.. (2001) Nanoscale fracture studies using the scanning force microscope. Applied physics letters, Vol. 78, H. 17. pp. 2485-2487.
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Official URL: http://edoc.unibas.ch/dok/A5262149
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Abstract
We present a variety of experiments concerning friction and fracture mechanisms using two-dimensional arrays of microfabricated nanotowers as templates. The scanning force microscope tip is used as a tool to apply well-defined forces to the surface of the patterned substrate. Force statistic measurements reveal information about the forces involved in the fracture process and the probability of fracture of selected towers. These methods are discussed in the context of nanometer-scale mechanisms. Using optimized parameters, a controlled removal of individual nanotowers and the ability to "write" predefined patterns on a nanometer scale can be achieved.
Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
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UniBasel Contributors: | Meyer, Ernst |
Item Type: | Article, refereed |
Article Subtype: | Research Article |
Publisher: | American Institute of Physics |
ISSN: | 0003-6951 |
Note: | Publication type according to Uni Basel Research Database: Journal article |
Identification Number: |
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Last Modified: | 22 Mar 2012 14:26 |
Deposited On: | 22 Mar 2012 13:54 |
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