Amberg, Matthias and Lüthi, Marcel and Vetter, Thomas. (2010) Local regression based statistical model fitting. In: Pattern Recognition : 32nd DAGM Symposium, Darmstadt, Germany, September 22-24, 2010. Proceedings. Berlin, pp. 452-461.
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| Faculties and Departments: | 05 Faculty of Science > Departement Mathematik und Informatik > Ehemalige Einheiten Mathematik & Informatik > Computergraphik Bilderkennung (Vetter) |
|---|---|
| UniBasel Contributors: | Vetter, Thomas and Lüthi, Marcel and Amberg, Matthias |
| Item Type: | Conference or Workshop Item, refereed |
| Conference or workshop item Subtype: | Conference Paper |
| Publisher: | Springer |
| ISBN: | 978-3-642-15986-2 ; 978-3-642-15985-5 |
| Series Name: | Lecture Notes in Computer Science |
| Issue Number: | 6376 |
| Note: | Publication type according to Uni Basel Research Database: Conference paper |
| Language: | English |
| Identification Number: | |
| edoc DOI: | |
| Last Modified: | 31 Dec 2015 10:48 |
| Deposited On: | 08 Jun 2012 06:31 |
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