Meyer, E. and Luthi, R. and Howald, L. and Bammerlin, M.. (1997) Instrumental aspects and contrast mechanisms of friction force microscopy. In: Micro/nanotribology and its applications. Dordrecht [etc.], pp. 193-215.
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Official URL: http://edoc.unibas.ch/dok/A5839467
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Abstract
Instrumental aspects, such as calibration procedures, resolution limits, 2-histogram technique and nanosled experiments are discussed. A major advantage of friction force microsopy is that wearless friction call he distinguished from processes that are accompanied by wear.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Conference or Workshop Item, refereed |
| Conference or workshop item Subtype: | Conference Paper |
| Publisher: | Kluwer Academic Publishers |
| ISBN: | 0-7923-4386-7 |
| Series Name: | NATO ASI series. Series E, Applied sciences |
| Issue Number: | Vol. 330 |
| Note: | Publication type according to Uni Basel Research Database: Conference paper |
| Identification Number: |
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| Last Modified: | 08 Jun 2012 06:54 |
| Deposited On: | 08 Jun 2012 06:33 |
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