Dammer, U. and Anselmetti, D. and Dreier, M. and Frommer, J. and Funfschilling, J. and Gerth, G. and Guntherodt, H. J. and Haefke, H. and Hidber, H. R. and Howald, L. and HUG, H. J. and Jung, T. H. and Lang, H. P. and Luthi, R. and Meyer, E. and Moser, A. and Parashikov, I. and Reimann, P. and Richmond, T. and Ruetschi, M. and Rudin, H. and Schwarz, U. D. and Staufer, U. and SUM, R.. (1993) Scanning probe microscopy for industrial applications : selected examples. Scanning, Vol. 15, H. 5. pp. 257-264.
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Official URL: http://edoc.unibas.ch/dok/A5839501
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Abstract
Some examples are selected to demonstrate the variety of possible scanning probe microscopy application in industry. Magnetic and magnetooptical storage media can be investigated by magnetic force microscopy, whereas a conventional scanning force microscope is used to examine surface features of many different materials, such as technical glasses, photosensitive materials, new superconductors, and biomolecules. Some other examples include the modification as well as the observation of liquid crystal devices, and the impact that scanning probe microscopy has on other techniques such as high precision stepping motors and high quality electron beam sources.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
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| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article |
| Article Subtype: | Research Article |
| Publisher: | Wiley |
| ISSN: | 0161-0457 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 14 Sep 2012 07:17 |
| Deposited On: | 14 Sep 2012 06:42 |
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