Luthi, R. and Overney, R. M. and Meyer, E. and Howald, L. and Brodbeck, D. and Guntherodt, H. J.. (1992) Measurements on Langmuir-Blodgett-films by friction force microscopy. Helvetica physica acta, Vol. 65, H. 6. pp. 866-867.
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Official URL: http://edoc.unibas.ch/dok/A5839512
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Abstract
A bidirectional force microscope (friction force microscope FFM) of a beam deflection type was built up for experiments at ambient conditions. Normal and lateral forces are measured simultaneously by detecting the deflection of a reflected laser beam with a four-quadrant photodiode. The relation of the topography measured with normal force perpendicular to the surface and the lateral force is discussed. We present FFM measurements on multilayers of Langmuir-Blodgett (LB) films. The friction is largest on the uncovered substrate and is reduced by the LB films acting as lubricant.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | Birkhäuser |
| ISSN: | 0018-0238 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 14 Sep 2012 07:18 |
| Deposited On: | 14 Sep 2012 06:43 |
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