Howald, L. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1995) Atomic-force microscopy on the Si(111) 7x7 surface. Physical Review B, Vol. 51, H. 8. pp. 5484-5487.
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Official URL: http://edoc.unibas.ch/dok/A5839483
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| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
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| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | American Institute of Physics |
| ISSN: | 0163-1829 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 14 Sep 2012 07:18 |
| Deposited On: | 14 Sep 2012 06:43 |
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