Meyer, E. and Luthi, R. and Howald, L. and Gutmannsbauer, W. and Haefke, H. and Guntherodt, H. J.. (1996) Friction force microscopy on well defined surfaces. Nanotechnology, Vol. 7, H. 4. pp. 340-344.
Full text not available from this repository.
Official URL: http://edoc.unibas.ch/dok/A5839469
Downloads: Statistics Overview
Abstract
Friction force microscopy is implemented in ultrahigh vacuum conditions, Atomic-scale friction is observed on clean surfaces. The onset of atomic-scale stick-slip is observed and discussed in relation to the plucking model. Comparative measurements of AgBr(001) versus NaCl(001) and C-60 versus NaCl(001) demonstrate the material-specific contrast of friction. Contrast mechanisms are discussed in relation to these experiments. The role of the chemical nature of the tip is exemplified for the case of Si(111) 7 x 7, where wearless sliding is achieved with a PTFE-coated probing tip.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | IOP Publ. |
| ISSN: | 0957-4484 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
|
| Last Modified: | 14 Sep 2012 07:18 |
| Deposited On: | 14 Sep 2012 06:43 |
Repository Staff Only: item control page