Guggisberg, M. and Bammerlin, M. and Luthi, R. and Loppacher, C. and Battiston, F. and Lu, J. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (1998) Comparison of dynamic lever STM and noncontact AFM. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S245-S248.
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Official URL: http://edoc.unibas.ch/dok/A5839457
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Abstract
We investigate interaction effects which occur in scanning tunneling microscopy (STM) by performing local force spectroscopy with an oscillating tip while imaging Si(111)7 x 7 terraces in the dynamic lever STM mode (constant time-averaged current). It is found that true atomic resolution is achieved close to the minimum of the resonance frequency vs. distance curve and even closer to the sample. On the other hand true atomic resolution in noncontact AFM (constant frequency shift) is expected several nm away from this minimum, in the range where the frequency shift becomes more negative with decreasing distance.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | Springer-Verlag |
| ISSN: | 1432-0630 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Identification Number: |
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| Last Modified: | 14 Sep 2012 07:18 |
| Deposited On: | 14 Sep 2012 06:45 |
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