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Atom-chip-based generation of entanglement for quantum metrology

Riedel, Max F. and Böhi, Pascal and Li, Yun and Hänsch, Theodor W. and Sinatra, Alice and Treutlein, Philipp. (2010) Atom-chip-based generation of entanglement for quantum metrology. Nature, Vol. 464, H. 7292. pp. 1170-1173.

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Official URL: http://edoc.unibas.ch/dok/A5841513

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Faculties and Departments:05 Faculty of Science > Departement Physik > Physik > Experimentelle Nanophysik (Treutlein)
UniBasel Contributors:Treutlein, Philipp and Riedel, Max and Böhi, Pascal
Item Type:Article, refereed
Article Subtype:Research Article
Publisher:Macmillan
ISSN:0028-0836
Note:Publication type according to Uni Basel Research Database: Journal article
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Last Modified:14 Sep 2012 07:18
Deposited On:14 Sep 2012 06:47

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