Ockeloen, Caspar F. and Schmied, Roman and Riedel, Max F. and Treutlein, Philipp. (2013) Quantum Metrology with a Scanning Probe Atom Interferometer. Physical review letters, Vol. 111, H. 14 , 143001.
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Official URL: http://edoc.unibas.ch/dok/A6212035
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Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Experimentelle Nanophysik (Treutlein) |
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UniBasel Contributors: | Treutlein, Philipp and Schmied, Roman and Ockeloen, Caspar Frederik and Riedel, Max |
Item Type: | Article, refereed |
Article Subtype: | Research Article |
Publisher: | American Physical Society |
ISSN: | 0031-9007 |
Note: | Publication type according to Uni Basel Research Database: Journal article |
Last Modified: | 31 Jan 2014 09:51 |
Deposited On: | 31 Jan 2014 09:51 |
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