Wirtz, Tom and Fleming, Yves and Gysin, Urs and Glatzel, Thilo and Wegmann, Urs and Meyer, Ernst and Maier, Urs and Rychen, Joerg. (2013) Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis. Microscopy and Microanalysis, Vol. 45, H. 1,. pp. 513-516.
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| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | Cambridge University Press |
| ISSN: | 1431-9276 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
| Language: | English |
| Related URLs: | |
| Identification Number: |
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| edoc DOI: | |
| Last Modified: | 13 Mar 2018 17:19 |
| Deposited On: | 27 Mar 2014 13:12 |
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