Thodkar, K. and Nef, C. and Fu, W. and Schönenberger, C. and Calame, M. and Lüönd, F. and Overney, F. and Jeckelmann, B. and Jeanneret, B.. (2014) CVD graphene for electrical quantum metrology. In: Conference on Precision Electromagnetic Measurements (CPEM 2014), 2014 : 24 - 29 Aug. 2014, Rio de Janeiro, Brazil. Piscataway, NJ, pp. 540-541.
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Official URL: http://edoc.unibas.ch/dok/A6381789
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Abstract
Graphene, a two dimensional material with sp2 hybridized carbon atoms arranged in honey comb lattice, is known for its unique electronic and mechanical properties. Soon after the isolation of 2D graphene crystals Quantum Hall effect (QHE) has been observed in this material at room temperature. The Quantum Hall plateaus in graphene have large spacing between the Landau levels in comparison to other 2DEGs, which makes it an ideal material for a quantum resistance standard defined by the electron charge and Planck s constant. We will present results for graphene by Chemical Vapor Deposition (CVD) and transferred to SiO2/Si using different techniques. The transferred graphene films were patterned into millimeter scale Hall bar geometry and characterized using confocal Raman spectroscopy. First electrical transport measurements will be presented.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Experimentalphysik Nanoelektronik (Schönenberger) |
|---|---|
| UniBasel Contributors: | Thodkar, Kishan and Nef, Cornelia and Fu, Wangyang and Calame, Michel and Schönenberger, Christian |
| Item Type: | Conference or Workshop Item, refereed |
| Conference or workshop item Subtype: | Conference Paper |
| Publisher: | IEEE |
| Note: | Publication type according to Uni Basel Research Database: Conference paper |
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| Identification Number: | |
| Last Modified: | 05 Jun 2015 08:52 |
| Deposited On: | 05 Jun 2015 08:52 |
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