Eren, B. and Gysin, U. and Marot, L. and Glatzel, Th and Steiner, R. and Meyer, E.. (2016) Work function of few layer graphene covered nickel thin films measured with Kelvin probe force microscopy. Applied Physics Letters, 108 (4). 041602.
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Abstract
Few layer graphene and graphite are simultaneously grown on a similar to 100 nm thick polycrystalline nickel film. The work function of few layer graphene/Ni is found to be 4.15 eV with a variation of 50 meV by local measurements with Kelvin probe force microscopy. This value is lower than the work function of free standing graphene due to peculiar electronic structure resulting from metal 3d-carbon 2p(pi) hybridization. (C) 2016 AIP Publishing LLC.
Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
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UniBasel Contributors: | Meyer, Ernst and Marot, Laurent and Glatzel, Thilo |
Item Type: | Article, refereed |
Article Subtype: | Research Article |
Publisher: | AIP Publishing |
ISSN: | 0003-6951 |
e-ISSN: | 1077-3118 |
Note: | Publication type according to Uni Basel Research Database: Journal article |
Language: | English |
Language: | English |
Identification Number: |
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edoc DOI: | |
Last Modified: | 31 Oct 2017 04:10 |
Deposited On: | 15 Feb 2017 10:29 |
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