Pfeiffer, O. and Bennewitz, R. and Baratoff, A. and Meyer, E. and Grutter, P.. (2002) Lateral-force measurements in dynamic force microscopy. Physical Review B, Vol. 65, H. 16 , 0161403, 4 S..
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Official URL: http://edoc.unibas.ch/dok/A5262140
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Abstract
Lateral forces between the tip of a force microscope and atomic-scale features on the surface of a sample can be accurately measured in a noncontact mode. Feedback-controlled excitation of the torsional eigenmode of a rectangular cantilever beam forces the tip to oscillate parallel to the surface. Forces of the order of 0.05 nN have been detected when the tip approaches a step or a sulphur impurity. The method can also be used to study the energy dissipation in the range where a tip-sample contact is formed.
| Faculties and Departments: | 05 Faculty of Science > Departement Physik > Physik > Nanomechanik (Meyer) |
|---|---|
| UniBasel Contributors: | Meyer, Ernst |
| Item Type: | Article, refereed |
| Article Subtype: | Research Article |
| Publisher: | American Institute of Physics |
| ISSN: | 0163-1829 |
| Note: | Publication type according to Uni Basel Research Database: Journal article |
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| Identification Number: | |
| Last Modified: | 22 Mar 2012 14:25 |
| Deposited On: | 22 Mar 2012 13:48 |
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