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Jump to: Article | Conference or Workshop Item ArticleRossmann, H. R. and Gysin, Urs and Bubendorf, Alexander and Glatzel, Thilo and Reshanov, Sergey and Schöner, Adolf and Jung, T. A. and Meyer, Ernst and Bartolf, Holger. (2015) Two-Dimensional Carrier Profiling on Lightly Doped n-Type 4H-SiC Epitaxially Grown Layers. Materials Science Forum, 821-823. pp. 269-272. Conference or Workshop ItemBartolf, H. and Gysin, U. and Rossmann, H. R. and Bubendorf, A. and Glatzel, T. and Jung, T. A. and Meyer, E. and Zimmermann, M. and Reshanov, S. and Schöner, A.. (2015) Development of power semiconductors by quantitative nanoscale dopant imaging. In: 2015 IEEE 27th International Symposium on Power Semiconductor Devices IC`s (ISPSD). pp. 281-284. |
