Items where Author is "Ghasemi, S. Alireza"

2017

Eivari, Hossein Asnaashari and Ghasemi, S. Alireza and Tahmasbi, Hossein and Rostami, Samare and Faraji, Somayeh and Rasoulkhani, Robabe and Goedecker, Stefan and Amsler, Maximilian. (2017) Two-Dimensional Hexagonal Sheet of TiO2. Chemistry of Materials, 29 (20). pp. 8594-8603.

2016

Zhu, Li and Amsler, Maximilian and Fuhrer, Tobias and Schaefer, Bastian and Faraji, Somayeh and Rostami, Samare and Ghasemi, S. Alireza and Sadeghi, Ali and Grauzinyte, Migle and Wolverton, Chris and Goedecker, Stefan. (2016) A fingerprint based metric for measuring similarities of crystalline structures. Journal of Chemical Physics, 144 (3). 034203.

2012

Sadeghi, Ali and Baratoff, Alexis and Ghasemi, S. Alireza and Goedecker, Stefan and Glatzel, Thilo and Kawai, Shigeki and Meyer, Ernst. (2012) Multiscale approach for simulations of Kelvin probe force microscopy with atomic resolution. Physical Review B, Vol. 86, H. 7 , 075407.

2010

Ghasemi, S. Alireza and Amsler, Maximilian and Hennig, Richard G. and Roy, Shantanu and Goedecker, Stefan and Lenosky, Thomas J. and Umrigar, C. J. and Genovese, Luigi and Morishita, Tetsuya and Nishio, Kengo. (2010) Energy landscape of silicon systems and its description by force fields, tight binding schemes, density functional methods, and quantum Monte Carlo methods. Physical Review B, Vol. 81, H. 21 , 214107.

Willand, Alex and Gramzow, Matthias and Ghasemi, S. Alireza and Genovese, Luigi and Deutsch, Thierry and Reuter, Karsten and Goedecker, Stefan. (2010) Structural metastability of endohedral silicon fullerenes. Physical Review B, Vol. 81, H. 20 , 201405.

2009

Amsler, Maximilian and Ghasemi, S. Alireza and Goedecker, Stefan and Neelov, Alexey and Genovese, Luigi. (2009) Adsorption of small NaCl clusters on surfaces of silicon nanostructures. Nanotechnology, Vol. 20, H. 44 , 445301, 6 S..

2008

Ghasemi, S. Alireza and Goedecker, Stefan and Baratoff, Alexis and Lenosky, Thomas and Meyer, Ernst and Hug, Hans J.. (2008) Ubiquitous mechanisms of energy dissipation in noncontact atomic force microscopy. Physical review letters, Vol. 100, H. 23 , 236106, 4 S..