Items where Author is "Hofer, R."

Group by: Date | Item Type | Refereed

Number of items: 1.

Article

Meyer, E. and Howald, L. and Luthi, R. and Haefke, H. and Ruetschi, M. and Bonner, T. and Overney, R. and Frommer, J. and Hofer, R. and Guntheroidt, H. J.. (1994) Scanning probe microscopy on the surface of Si(111). Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 2060-2063.

This list was generated on Mon Dec 23 05:14:04 2024 CET.

edoc-vmtest is powered by EPrints 3 which is developed by the School of Electronics and Computer Science at the University of Southampton.