Items where Author is "Luthi, R."

2003

Loppacher, C. and Guggisberg, M. and Pfeiffer, O. and Meyer, E. and Bammerlin, M. and Luthi, R. and Schlittler, R. and Gimzewski, J. K. and Tang, H. and Joachim, C.. (2003) Direct determination of the energy required to operate a single molecule switch. Physical review letters, Vol. 90, H. 6 , 066107, 4 S..

2000

Guggisberg, M. and Bammerlin, M. and Baratoff, A. and Luthi, R. and Loppacher, C. and Battiston, F. M. and Lu, J. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J.. (2000) Dynamic force microscopy across steps on the Si(111)-(7 x 7) surface. Surface science, Vol. 461, H. 1-3. pp. 255-265.

1999

Eng, L. M. and Bammerlin, M. and Loppacher, C. and Guggisberg, M. and Bennewitz, R. and Luthi, R. and Meyer, E. and Huser, T. and Heinzelmann, H. and Guntherodt, H. J.. (1999) Ferroelectric domain characterisation and manipulation: a challenge for scanning probe microscopy. Ferroelectrics, Vol. 222, H. 1-4. pp. 411-420.

Eng, L. M. and Bammerlin, M. and Loppacher, C. and Guggisberg, M. and Bennewitz, R. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1999) Surface morphology, chemical contrast, and ferroelectric domains in TGS bulk single crystals differentiated with UHV non-contact force microscopy. Applied surface science, Vol. 140, H. 3-4. pp. 253-258.

1998

Battiston, F. M. and Bammerlin, M. and Loppacher, C. and Guggisberg, M. and Luthi, R. and Meyer, E. and Eggimann, F. and Guntherodt, H. J.. (1998) Combined scanning tunneling and force microscope with fuzzy controlled feedback. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S49-S53.

Guggisberg, M. and Bammerlin, M. and Luthi, R. and Loppacher, C. and Battiston, F. and Lu, J. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (1998) Comparison of dynamic lever STM and noncontact AFM. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S245-S248.

Bammerlin, M. and Luthi, R. and Meyer, E. and Baratoff, A. and Lu, J. and Guggisberg, M. and Loppacher, C. and Gerber, C. and Guntherodt, H. J.. (1998) Dynamic SFM with true atomic resolution on alkali halide surfaces. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S293-S294.

Loppacher, C. and Bammerlin, M. and Battiston, F. and Guggisberg, M. and Muller, D. and Hidber, H. R. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1998) Fast digital electronics for application in dynamic force microscopy using high-Q cantilevers. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S215-S218.

Meyer, E. and Hug, H. J. and Luthi, R. and Stiefel, B. and Guntherodt, H. J.. (1998) Forces in scanning probe microscopy. In: Nanoscale science and technology. Dordrecht [etc.], pp. 23-39.

Battiston, F. M. and Bammerlin, M. and Loppacher, C. and Luthi, R. and Meyer, E. and Guntherodt, H. J. and Eggimann, F.. (1998) Fuzzy controlled feedback applied to a combined scanning tunneling and force microscope. Applied physics letters, Vol. 72, H. 1. pp. 25-27.

Lu, J. and Guggisberg, M. and Luthi, R. and Kubon, M. and Scandella, L. and Gerber, C. and Meyer, E. and Guntherodt, H. J.. (1998) Surface potential studies using Kelvin force spectroscopy. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S273-S275.

1997

Meyer, E. and Luthi, R. and Howald, L. and Bammerlin, M.. (1997) Instrumental aspects and contrast mechanisms of friction force microscopy. In: Micro/nanotribology and its applications. Dordrecht [etc.], pp. 193-215.

Luthi, R. and Meyer, E. and Bammerlin, M. and Baratoff, A. and Howald, L. and Gerber, C. and Guntherodt, H. J.. (1997) Ultrahigh vacuum atomic force microscopy : true atomic resolution. Surface review and letters, Vol. 4, H. 5. pp. 1025-1029.

1996

Luthi, R. and Meyer, E. and Bammerlin, M. and Baratoff, A. and Lehmann, T. and Howald, L. and Gerber, C. and Guntherodt, H. J.. (1996) Atomic resolution in dynamic force microscopy across steps on Si(111)7 x 7. Zeitschrift für Physik. B, Condensed matter, Vol. 100, H. 2. pp. 165-167.

Meyer, E. and Luthi, R. and Howald, L. and Gutmannsbauer, W. and Haefke, H. and Guntherodt, H. J.. (1996) Friction force microscopy on well defined surfaces. Nanotechnology, Vol. 7, H. 4. pp. 340-344.

Meyer, E. and Luthi, R. and Howald, L. and Bammerlin, M. and Guggisberg, M. and Guntherodt, H. J. and Scandella, L. and Gobrecht, J. and Schumacher, A. and Prins, R.. (1996) Friction force spectroscopy. In: Physics of sliding friction. Dordrecht [etc.], pp. 349-367.

Scandella, L. and Meyer, E. and Howald, L. and Luthi, R. and Guggisberg, M. and Gobrecht, J. and Guntherodt, H. J.. (1996) Friction forces on hydrogen passivated (110) silicon and silicon dioxide studied by scanning force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. pp. 1255-1258.

Luthi, R. and Meyer, E. and Bammerlin, M. and Howald, L. and Haefke, H. and Lehmann, T. and Loppacher, C. and Guntherodt, H. J. and Gyalog, T. and Thomas, H.. (1996) Friction on the atomic scale : an ultrahigh vacuum atomic force microscopy study on ionic crystals. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. pp. 1280-1284.

Schumacher, A. and Kruse, N. and Prins, R. and Meyer, E. and Luthi, R. and Howald, L. and Guntherodt, H. J. and Scandella, L.. (1996) Influence of humidity on friction measurements of supported MoS2 single layers. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. pp. 1264-1267.

Meyer, E. and Luthi, R. and Howald, L. and Bammerlin, M. and Guggisberg, M. and Guntherodt, H. J.. (1996) Site-specific friction force spectroscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 14, H. 2. pp. 1285-1288.

1995

Howald, L. and Luthi, R. and Meyer, E. and Guntherodt, H. J.. (1995) Atomic-force microscopy on the Si(111) 7x7 surface. Physical Review B, Vol. 51, H. 8. pp. 5484-5487.

Meyer, E. and Luthi, R. and Howald, L. and Guntherodt, H. J.. (1995) Friction force microscopy. In: Forces in scanning probe methods. Dordrecht [etc.], pp. 285-306.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Guntherodt, H. J. and Gyalog, T. and Thomas, H.. (1995) Friction force microscopy in ultrahigh vacuum : an atomic-scale study. Abstracts of papers / American Chemical Society, Vol. 209, H. Part 1 , S. 143-COLL.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Guntherodt, H. J.. (1995) Friction force microscopy in ultrahigh-vacuum - study on C-60 thin-films deposited on NaCl. Abstracts of papers / American Chemical Society, Vol. 209, H. Part 1 , S. 216-COLL.

Gyalog, T. and Bammerlin, M. and Luthi, R. and Meyer, E. and Thomas, H.. (1995) Mechanism of Atomic Friction. Europhysics Letters, Vol. 31, H. 5-6. pp. 269-274.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Gutmannsbauer, W. and Guggisberg, M. and Bammerlin, M. and Guntherodt, H. J.. (1995) Nanotribology : an UHV-SFM study on thin-films of C60 and AgBr. Surface science, Vol. 338, H. 1-3. pp. 247-260.

1994

Anselmetti, D. and Luthi, R. and Meyer, E. and Richmond, T. and Dreier, M. and Frommer, J. E. and Guntherodt, H. J.. (1994) Attractive-mode imaging of biological materials with dynamic force microscopy. Nanotechnology, Vol. 5, H. 2. pp. 87-94.

Anselmetti, D. and Dreier, M. and Luthi, R. and Richmond, T. and Meyer, E. and Frommer, J. and Guntherodt, H. J.. (1994) Biological materials studied with dynamic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 1500-1503.

Overney, R. M. and Bonner, T. and Meyer, E. and Reutschi, M. and Luthi, R. and Howald, L. and Frommer, J. and Guntherodt, H. J. and Fujihara, M. and Takano, H.. (1994) Elasticity, wear, and friction properties of thin organic films observed with atomic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 1973-1976.

Howald, L. and Luthi, R. and Meyer, E. and Gerth, G. and Haefke, H. G. and Overney, R. and Guntherodt, H. J.. (1994) Friction force microscopy on clean surfaces of NaCl, NaF, and AgBr. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 2227-2230.

Luthi, R. and Haefke, H. and Meyer, E. and Howald, L. and Lang, H. P. and Gerth, G. and Guntherodt, H. J.. (1994) Frictional and atomic-scale study of C60 thin films by scanning force microscopy. Zeitschrift für Physik. B, Condensed matter, Vol. 95, H. 1. pp. 1-3.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Guntherodt, H. J.. (1994) Nanosled experiments - determination of dissipation and cohesive energies of C-60 with UHV-SFM. Helvetica physica acta, Vol. 67, H. 7. pp. 755-756.

Luthi, R. and Meyer, E. and Howald, L. and Haefke, H. and Anselmetti, D. and Dreier, M. and Ruetsche, M. and Bonner, T. and Overney, R. M. and Frommer, J. and Guntherodt, H. J.. (1994) Progress in noncontract dynamic force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 1673-1676.

Howald, L. and Luthi, R. and Meyer, E. and Guthner, P. and Guntherodt, H. J.. (1994) Scanning force microscopy on the Si(111)7×7 surface reconstruction. Zeitschrift für Physik. B, Condensed matter, Vol. 93, H. 3. pp. 267-268.

Meyer, E. and Howald, L. and Luthi, R. and Haefke, H. and Ruetschi, M. and Bonner, T. and Overney, R. and Frommer, J. and Hofer, R. and Guntheroidt, H. J.. (1994) Scanning probe microscopy on the surface of Si(111). Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 3. pp. 2060-2063.

Luthi, R. and Meyer, E. and Haefke, H. and Howald, L. and Gutmannsbauer, W. and Guntherodt, H. J.. (1994) Sled-type motion on the nanometer scale : determination of dissipation and cohesive energies of C-60. Science, Vol. 266, H. 5193. pp. 1979-1981.

Luthi, R. and Haefke, H. and Gutmannsbauer, W. and Meyer, E. and Howald, L. and Guntherodt, H. J.. (1994) Statics and dynamics of ferroelectric domains studied with scanning force microscopy. Journal of vacuum science & technology. B, Microelectronics and nanometer structures processing, measurement, and phenomena, Vol. 12, H. 4. pp. 2451-2455.

Scandella, L. and Schumacher, A. and Kruse, N. and Prins, R. and Meyer, E. and Luthi, R. and Howald, L. and Guntherodt, H. J.. (1994) Tribology of ultra-thin MoS2 platelets on mica : studies by scanning force microscopy. Thin Solid Films, Vol. 240, H. 1-2. pp. 101-104.

Howald, L. and Haefke, H. and Luthi, R. and Meyer, E. and Gerth, G. and Rudin, H. and Guntherodt, H. J.. (1994) Ultrahigh-vacuum scanning force microscopy : atomic-scale resolution at monatomic cleavage steps. Physical Review B, Vol. 49, H. 8. pp. 5651-5656.

1993

Frommer, J. and Luthi, R. and Meyer, E. and Anselmetti, D. and Dreier, M. and Overney, R. and Guntherodt, H. J. and Fujihira, M.. (1993) Adsorption at domain edges. Nature, Vol. 364, H. 6434. p. 198.

Overney, R. M. and Luthi, R. and Haefke, H. and Frommer, J. and Meyer, E. and Guntherodt, H. J. and Hild, S. and Fuhrmann, J.. (1993) An atomic force microscopy study of corona-treated polypropylene films. Applied surface science, Vol. 64, H. 3. pp. 197-203.

Bogli, U. and Blatter, A. and Bachli, A. and Luthi, R. and Meyer, E.. (1993) Characterization of laser-irradiated surfaces of a polycrystalline diamond film with an atomic-force microscope. Diamond And Related Materials, Vol. 2, H. 5-7. pp. 924-927.

Luthi, R. and Haefke, H. and Meyer, K. P. and Meyer, E. and Howald, L. and Ruetschi, M. and Overney, R. M. and Guntherodt, H. J.. (1993) Investigation on ferroelectric domains and domain-walls with scanning force microscopy. Helvetica physica acta, Vol. 66, H. 4. pp. 415-416.

Howald, L. and Meyer, E. and Luthi, R. and Haefke, H. and Overney, R. and Rudin, H. and Guntherodt, H. J.. (1993) Multifunctional probe microscope for facile operation in ultrahigh-vacuum. Applied physics letters, Vol. 63, H. 1. pp. 117-119.

Dammer, U. and Anselmetti, D. and Dreier, M. and Frommer, J. and Funfschilling, J. and Gerth, G. and Guntherodt, H. J. and Haefke, H. and Hidber, H. R. and Howald, L. and HUG, H. J. and Jung, T. H. and Lang, H. P. and Luthi, R. and Meyer, E. and Moser, A. and Parashikov, I. and Reimann, P. and Richmond, T. and Ruetschi, M. and Rudin, H. and Schwarz, U. D. and Staufer, U. and SUM, R.. (1993) Scanning probe microscopy for industrial applications : selected examples. Scanning, Vol. 15, H. 5. pp. 257-264.

Luthi, R. and Haefke, H. and Meyer, K. P. and Meyer, E. and Howald, L. and Guntherodt, H. J.. (1993) Surface and domain structures of ferroelectric crystals studied with scanning force microscopy. Journal of applied physics, Vol. 74, H. 12. pp. 7461-7471.

1992

Howald, L. and Luthi, R. and Meyer, E. and Haefke, H. and Overney, R. and Gerth, G. and Rudin, H. and Guntherodt, H. J.. (1992) Bidirectional force microscope for surface-analysis in ultrahigh-vacuum. Helvetica physica acta, Vol. 65, H. 6. pp. 868-869.

Meyer, E. and Overney, R. and Brodbeck, D. and Howald, L. and Luthi, R. and Frommer, J. and Guntherodt, H. J.. (1992) Friction and wear of Langmuir-Blodgett films observed by friction force microscopy. Physical review letters, Vol. 69, H. 12. pp. 1777-1780.

Meyer, E. and Overney, R. and Luthi, R. and Brodbeck, D. and Howald, L. and Frommer, J. and Guntherodt, H. J. and Wolter, O. and Fujihira, M. and Takano, H. and Gotoh, Y.. (1992) Friction forc emicroscopy of mixed Langmuir-Blodgett films. Thin Solid Films, Vol. 220, H. 1-2. pp. 132-137.

Overney, R. M. and Meyer, E. and Frommer, J. and Brodbeck, D. and Luthi, R. and Howald, L. and Guntherodt, H. J. and Fujihira, M. and Takano, H. and Gotoh, Y.. (1992) Friction measurements on phase-separated thin films with a modified atomic force microscope. Nature, Vol. 359, H. 6391. pp. 133-135.

Luthi, R. and Overney, R. M. and Meyer, E. and Howald, L. and Brodbeck, D. and Guntherodt, H. J.. (1992) Measurements on Langmuir-Blodgett-films by friction force microscopy. Helvetica physica acta, Vol. 65, H. 6. pp. 866-867.

Brodbeck, D. and Howald, L. and Luthi, R. and Meyer, E. and Overney, R.. (1992) Scan control and data acquisition for bidirectional force microscopy. Ultramicroscopy, Vol. 42, Part B. pp. 1580-1584.

Meyer, E. and Howald, L. and Overney, R. and Brodbeck, D. and Luthi, R. and Haefke, H. and Frommer, J. and Guntherodt, H. J.. (1992) Structure and dynamics of solid surfaces observed by atomic force microscopy. Ultramicroscopy, Vol. 42, Part A. pp. 274-280.