Items where Author is "Rast, S."

2011

Gysin, U. and Rast, S. and Kisiel, M. and Werle, C. and Meyer, E.. (2011) Low temperature ultrahigh vacuum noncontact atomic force microscope in the pendulum geometry. Review of scientific instruments, Vol. 82, H. 2 , 023705.

2009

Rast, S. and Gysin, U. and Meyer, E.. (2009) Phase noise induced due to amplitude fluctuations in dynamic force microscopy. Physical Review B, Vol. 79, H. 5 , 054106, 6 S..

2006

Rast, S. and Gysin, U. and Ruff, P. and Gerber, C. and Meyer, E. and Lee, D. W.. (2006) Force microscopy experiments with ultrasensitive cantilevers. Nanotechnology, Vol. 17, H. 7, Sp. Iss. SI , S189-S194.

2005

Lee, D. W. and Kang, J. H. and Gysin, U. and Rast, S. and Meyer, E. and Despont, M. and Gerber, C.. (2005) Fabrication and evaluation of single-crystal silicon cantilevers with ultra-low spring constants. Journal of micromechanics and microengineering, Vol. 15, H. 11. pp. 2179-2183.

2000

Rast, S. and Wattinger, C. and Gysin, U. and Meyer, E.. (2000) Dynamics of damped cantilevers. Review of scientific instruments, Vol. 71, H. 7. pp. 2772-2775.

Rast, S. and Wattinger, C. and Gysin, U. and Meyer, E.. (2000) The noise of cantilevers. Nanotechnology, Vol. 11, H. 3. pp. 169-172.

Pfeiffer, O. and Loppacher, C. and Wattinger, C. and Bammerlin, M. and Gysin, U. and Guggisberg, M. and Rast, S. and Bennewitz, R. and Meyer, E. and Guntherodt, H. J.. (2000) Using higher flexural modes in non-contact force microscopy. Applied surface science, Vol. 157, H. 4. pp. 337-342.

1999

Loppacher, C. and Bammerlin, M. and Guggisberg, M. and Battiston, F. and Bennewitz, R. and Rast, S. and Baratoff, A. and Meyer, E. and Guntherodt, H. J.. (1999) Phase variation experiments in non-contact dynamic force microscopy using phase locked loop techniques. Applied surface science, Vol. 140, H. 3-4. pp. 287-292.

1998

Streckeisen, P. and Rast, S. and Wattinger, C. and Meyer, E. and Vettiger, P. and Gerber, C. and Guntherodt, H. J.. (1998) Instrumental aspects of magnetic resonance force microscopy. Applied physics. A, Materials science & processing, Vol. 66, Part 1 Suppl. S , S341-S344.