Items where Author is "Riedel, Max F."

Yes

Ockeloen, Caspar F. and Schmied, Roman and Riedel, Max F. and Treutlein, Philipp. (2013) Quantum Metrology with a Scanning Probe Atom Interferometer. Physical review letters, Vol. 111, H. 14 , 143001.

Riedel, Max F. and Böhi, Pascal and Li, Yun and Hänsch, Theodor W. and Sinatra, Alice and Treutlein, Philipp. (2010) Atom-chip-based generation of entanglement for quantum metrology. Nature, Vol. 464, H. 7292. pp. 1170-1173.

Böhi, Pascal and Riedel, Max F. and Hänsch, Theodor W. and Treutlein, Philipp. (2010) Imaging of microwave fields using ultracold atoms. Applied physics letters, Vol. 97, H. 5 , 051101.

No

Böhi, Pascal and Riedel, Max F. and Treutlein, Philipp. (2011) Cold atoms image microwave fields. SPS Communications, Vol. 33. p. 10.