edoc-vmtest

Items where Author is "Rychen, Joerg"

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Date | Item Type | Refereed
Jump to: 2013
Number of items: 1.

2013

Wirtz, Tom and Fleming, Yves and Gysin, Urs and Glatzel, Thilo and Wegmann, Urs and Meyer, Ernst and Maier, Urs and Rychen, Joerg. (2013) Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis. Microscopy and Microanalysis, Vol. 45, H. 1,. pp. 513-516.

This list was generated on Thu Nov 21 05:36:20 2024 CET.
edoc-vmtest is powered by EPrints 3 which is developed by the School of Electronics and Computer Science at the University of Southampton.