Items where Author is "Schöner, Adolf"
Jump to: 2015 Number of items: 2. 2015Gysin, Urs and Glatzel, Thilo and Schmölzer, Thomas and Schöner, Adolf and Reshanov, Sergey and Bartolf, Holger and Meyer, Ernst. (2015) Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices. Beilstein Journal of Nanotechnology, 6. pp. 2485-2497. Rossmann, H. R. and Gysin, Urs and Bubendorf, Alexander and Glatzel, Thilo and Reshanov, Sergey and Schöner, Adolf and Jung, T. A. and Meyer, Ernst and Bartolf, Holger. (2015) Two-Dimensional Carrier Profiling on Lightly Doped n-Type 4H-SiC Epitaxially Grown Layers. Materials Science Forum, 821-823. pp. 269-272. |
