Items where Author is "Wirtz, Tom"
Jump to: Article Number of items: 2. ArticleWirtz, Tom and Fleming, Yves and Gysin, Urs and Glatzel, Thilo and Wegmann, Urs and Meyer, Ernst and Maier, Urs and Rychen, Joerg. (2013) Combined SIMS-SPM instrument for high sensitivity and high-resolution elemental 3D analysis. Microscopy and Microanalysis, Vol. 45, H. 1,. pp. 513-516. Wirtz, Tom and Fleming, Yves and Gerard, Mathieu and Gysin, Urs and Glatzel, Thilo and Meyer, Ernst and Wegmann, Urs and Maier, Urs and Odriozola, Aitziber Herrero and Uehli, Daniel. (2012) Design and performance of a combined secondary ion mass spectrometry-scanning probe microscopy instrument for high sensitivity and high-resolution elemental three-dimensional analysis. Review of scientific instruments, Vol. 83, H. 6 , 063702. |
